发明授权
US4654119A Method for making submicron mask openings using sidewall and lift-off
techniques
失效
使用侧壁和剥离技术制造亚微米掩模开口的方法
- 专利标题: Method for making submicron mask openings using sidewall and lift-off techniques
- 专利标题(中): 使用侧壁和剥离技术制造亚微米掩模开口的方法
-
申请号: US799053申请日: 1985-11-18
-
公开(公告)号: US4654119A公开(公告)日: 1987-03-31
- 发明人: Robert K. Cook , Joseph F. Shepard
- 申请人: Robert K. Cook , Joseph F. Shepard
- 申请人地址: NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: NY Armonk
- 主分类号: H01L21/302
- IPC分类号: H01L21/302 ; H01L21/033 ; H01L21/3065 ; H01L21/306
摘要:
A method is disclosed for making submicron openings in a substrate. A mesa is formed on the substrate by reactive ion etching techniques. A film is deposited over the entire structure and the mesa is selectively etched away to yield a submicron-sized opening in the film. Using the film as a mask, the substrate exposed thereby is reactively ion etched. An example is given for producing an emitter mask for a polycrystalline silicon base bipolar transistor.
公开/授权文献
信息查询
IPC分类: