发明授权
- 专利标题: Apparatus for measuring luminescence lifetime
- 专利标题(中): 用于测量发光寿命的装置
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申请号: US746565申请日: 1985-06-19
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公开(公告)号: US4662748A公开(公告)日: 1987-05-05
- 发明人: Masaru Tanaka , Kiyoaki Hara , Issei Yokoyama
- 申请人: Masaru Tanaka , Kiyoaki Hara , Issei Yokoyama
- 申请人地址: JPX Kyoto
- 专利权人: Horiba, Ltd.
- 当前专利权人: Horiba, Ltd.
- 当前专利权人地址: JPX Kyoto
- 优先权: JPX59-132223 19840626
- 主分类号: G01N21/64
- IPC分类号: G01N21/64 ; G01J3/443
摘要:
Two sets of TACs are simultaneously operated by a start pulse, one set of TACs using a photoelectron pulse due to an excited light from a sample as a stop pulse, and the other set of TACs using a photoelectron pulse due to a fluorescence from the sample as a stop pulse. Each TAC outputs a voltage proportional to the time from the start of action to the receiving of the stop pulse and an excitation light shape and a luminescence transient shape are simultaneously measured on the basis of output voltages from the TACs. A variable offset voltage is added to an output of at least one of the two sets of TACs and the excitation light shape and the luminescence transient shape are displayed on a two-picture synthetic display.
公开/授权文献
- US5904203A Chill plate and stacked mold 公开/授权日:1999-05-18
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