Invention Grant
- Patent Title: Scanning tunneling microscope
- Patent Title (中): 扫描隧道显微镜
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Application No.: US836274Application Date: 1986-03-05
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Publication No.: US4668865APublication Date: 1987-05-26
- Inventor: James K. Gimzewski , Wolfgang D. Pohl
- Applicant: James K. Gimzewski , Wolfgang D. Pohl
- Applicant Address: NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: NY Armonk
- Priority: EPX85102554.4 19850307
- Main IPC: H01J37/28
- IPC: H01J37/28 ; B81B3/00 ; G01B7/34 ; G01N23/00 ; G01N27/00 ; G01Q10/04 ; G01Q30/04 ; G01Q30/18 ; G01Q30/20 ; G01Q60/10 ; G01Q60/16 ; G01Q70/02 ; G01Q70/06 ; G01Q70/18 ; H01J37/20 ; H04R19/00 ; G12B1/00
Abstract:
An improved scanning tunneling microscope comprising a semiconductor chip into which slots are etched to form a central portion linked by a first pair of stripes to an intermediate portion, which in turn is linked by a second pair of stripes to the main body of the chip. The pairs of stripes have mutually orthogonal directions to allow the center portion to perform movements in the x- and y-directions under the control of electrostatic forces created between the stripes and their opposite walls. The center portion has formed into it at least one tongue carrying an integrated, protruding tunnel tip which is capable of being moved in the z-direction by means of electrostatic forces between said tongue and the bottom of a cavity below the tongue.
Public/Granted literature
- US6164819A Temperature sensor and a method of manufacturing the same Public/Granted day:2000-12-26
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