发明授权
- 专利标题: Method for forming a deposited film
- 专利标题(中): 沉积膜形成方法
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申请号: US722133申请日: 1985-04-11
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公开(公告)号: US4683144A公开(公告)日: 1987-07-28
- 发明人: Yukuo Nishimura , Ken Eguchi , Hiroshi Matsuda , Masahiro Haruta , Yutaka Hirai , Takashi Nakagiri
- 申请人: Yukuo Nishimura , Ken Eguchi , Hiroshi Matsuda , Masahiro Haruta , Yutaka Hirai , Takashi Nakagiri
- 申请人地址: JPX Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX59-76126 19840416; JPX59-76127 19840416; JPX59-76130 19840416; JPX59-76131 19840416
- 主分类号: B05D3/06
- IPC分类号: B05D3/06 ; B05D7/24 ; C23C16/22 ; C23C16/48 ; H01L21/205
摘要:
A method for forming a deposited film comprises forming a gaseous atmosphere of a silane compound represented by the general formula: Si.sub.n H.sub.2n+2 (n.gtoreq.1) and a halogen compound in a deposition chamber in which a substrate is arranged, and exciting and decomposing these compounds by utilization of photoenergy thereby to form the deposited film containing silicon atoms on said substrate.A method for forming a deposited film comprises forming a gaseous atmosphere of a silane compound represented by the general formula: Si.sub.n H.sub.2n+2 (n.gtoreq.1), a halogen compound and a compound containing atoms belonging too the group III or the group V of the periodic table in a deposition chamber in which a substrate is arranged, and exciting and decomposing these compounds by utilization of photoenergy thereby to form a deposited film containing silicon atoms and the atoms belonging to the group III or the group V of the periodic table on said substrate.
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