发明授权
- 专利标题: Position detecting system
- 专利标题(中): 位置检测系统
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申请号: US737434申请日: 1985-05-24
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公开(公告)号: US4702606A公开(公告)日: 1987-10-27
- 发明人: Toshio Matsuura , Seiro Murakami , Yuji Imai , Kazuya Ohta , Akikazu Tanimoto
- 申请人: Toshio Matsuura , Seiro Murakami , Yuji Imai , Kazuya Ohta , Akikazu Tanimoto
- 申请人地址: JPX Tokyo
- 专利权人: Nippon Kogaku K.K.
- 当前专利权人: Nippon Kogaku K.K.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX59-112370 19840601; JPX59-119463 19840611
- 主分类号: G03F7/20
- IPC分类号: G03F7/20 ; G03F9/00 ; G01B11/00
摘要:
An alignment system includes an element bearing a plurality of patterns on the surface thereof, the plurality of patterns being arranged in a predetermined direction, a stage for holding the element, scanning means for scanning the plurality of patterns of the element held by the stage in the predetermined direction and making position signals indicative of the positions of the plurality of patterns in the predetermined direction on the element, and operation means for operating and putting out a signal indicative of a position which is in a predetermined relation with the positions of the plurality of patterns in the predetermined direction, on the basis of the position signals.
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