发明授权
- 专利标题: Apparatus for quantitative secondary ion mass spectrometry
- 专利标题(中): 定量二次离子质谱仪
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申请号: US20181申请日: 1987-02-26
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公开(公告)号: US4766313A公开(公告)日: 1988-08-23
- 发明人: Yoshikazu Homma , Yoshikazu Ishii
- 申请人: Yoshikazu Homma , Yoshikazu Ishii
- 申请人地址: JPX Tokyo
- 专利权人: Nippon Telegraph & Telephone Public Corporation
- 当前专利权人: Nippon Telegraph & Telephone Public Corporation
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX59-53462 19840322; JPX59-140241 19840706
- 主分类号: G01Q30/10
- IPC分类号: G01Q30/10 ; G01Q30/16 ; H01J37/252 ; H01J49/24
摘要:
An apparatus for quantitative secondary ion mass spectrometry comprising a sealed chamber for storing a sample containing a light impurity element which is to be analyzed, secondary ion generating means for bombarding a primary ion beam onto the sample so as to allow the sample to emit a secondary ion of the light element, and quantitative analyzing means for detecting the secondary ion so as to quantitatively analyze the light element contained in the sample. First evacuating means evacuates said sealed chamber to an ultrahigh vacuum during quantitative analysis. First cryopanel means is arranged to surround the sample, and first cooling means keeps said first cryopanel means at a cryogenic temperature during quantitative analysis so that said first cryopanel means adsorbs a gas present in said sealed chamber.
公开/授权文献
- USD359777S Recumbent total body exerciser 公开/授权日:1995-06-27
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