发明授权
US4773046A Semiconductor device having fuse circuit and detecting circuit for
detecting states of fuses in the fuse circuit
失效
具有熔丝电路的半导体装置和用于检测熔丝电路中熔丝状态的检测电路
- 专利标题： Semiconductor device having fuse circuit and detecting circuit for detecting states of fuses in the fuse circuit
- 专利标题（中）： 具有熔丝电路的半导体装置和用于检测熔丝电路中熔丝状态的检测电路
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申请号： US60018申请日： 1987-06-09
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公开(公告)号： US4773046A公开(公告)日： 1988-09-20
- 发明人: Takao Akaogi , Hiromi Kawashima
- 申请人： Takao Akaogi , Hiromi Kawashima
- 申请人地址： JPX Kawasaki
- 专利权人： Fujitsu Limited
- 当前专利权人： Fujitsu Limited
- 当前专利权人地址： JPX Kawasaki
- 优先权： JPX61-133782 19860611
- 主分类号： G11C17/16
- IPC分类号： G11C17/16 ; G11C17/18 ; G11C29/00 ; G11C29/04 ; G11C13/00 ; G11C11/36
摘要：
A semiconductor device comprises a fuse circuit having first and second fuses for storing an information bit represented by blown or unblown states of the fuses. The device uses an information output circuit for providing an output signal having a first logic level when at least one of the fuses is blown and an output signal having a second logic level when both the fuses are unblown. A detecting circuit in the device detects which one of the fuses is unblown.
公开/授权文献
- US4256219A Cable or chain actuated chip conveyor 公开/授权日：1981-03-17
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