Apparatus is provided for testing a data processing system which includes a microprocessor, the testing occurring with the microprocessor in place in the system. The apparatus comprises: a support microprocessor for controlling the testing, a serial-to-parallel and parallel-to-serial converter connected between the support microprocessor and the system microprocessor, means for supplying a series of level sensitive scan design (LSSD) test signals from the support microprocessor through the converter to the system microprocessor, and means for returning the results of the level sensitive scan design test signals from the system microprocessor through the converter to the support microprocessor.