发明授权
US4818868A Trochoidal analysis of scattered electrons in a merged electron-ion beam geometry 失效
在合并的电子 - 离子束几何中的散射电子的卷积分析

Trochoidal analysis of scattered electrons in a merged electron-ion beam
geometry
摘要:
The method and apparatus of this invention provides a plurality of measurements indicative of the absolute cross section for excitation of an ion beam. The ion beam is merged for excitation by specific energies of electrons in an electron beam. Both beams are merged in an evacuated enclosure having a longitudinal magnetic field and a crossed uniform electric field. The ions and electrons interact over a known merged longitudinal length in a merged beam area. After collision, the electron and ion beams are demerged. Forward and backward-scattered electrons are collected and position-detected by a pair of microchannel plate arrays located at opposite ends of the longitudinal beam-merging area. A series of electron and ion primary current measurements are taken at full ion and electron beam strength. Measurements are also taken at greatly reduced beam strength to obtain a beam overlap profile.
公开/授权文献
信息查询
0/0