发明授权
US4818868A Trochoidal analysis of scattered electrons in a merged electron-ion beam
geometry
失效
在合并的电子 - 离子束几何中的散射电子的卷积分析
- 专利标题: Trochoidal analysis of scattered electrons in a merged electron-ion beam geometry
- 专利标题(中): 在合并的电子 - 离子束几何中的散射电子的卷积分析
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申请号: US154713申请日: 1988-02-11
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公开(公告)号: US4818868A公开(公告)日: 1989-04-04
- 发明人: Ara Chutjian
- 申请人: Ara Chutjian
- 申请人地址: DC Washington
- 专利权人: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
- 当前专利权人: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
- 当前专利权人地址: DC Washington
- 主分类号: G01T1/29
- IPC分类号: G01T1/29 ; H01S1/00 ; G01K1/08 ; H01J3/14
摘要:
The method and apparatus of this invention provides a plurality of measurements indicative of the absolute cross section for excitation of an ion beam. The ion beam is merged for excitation by specific energies of electrons in an electron beam. Both beams are merged in an evacuated enclosure having a longitudinal magnetic field and a crossed uniform electric field. The ions and electrons interact over a known merged longitudinal length in a merged beam area. After collision, the electron and ion beams are demerged. Forward and backward-scattered electrons are collected and position-detected by a pair of microchannel plate arrays located at opposite ends of the longitudinal beam-merging area. A series of electron and ion primary current measurements are taken at full ion and electron beam strength. Measurements are also taken at greatly reduced beam strength to obtain a beam overlap profile.
公开/授权文献
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