发明授权
- 专利标题： Apparatus and process for improved detection limits in mass spectrometry
- 专利标题（中）： 用于改进质谱检测限的装置和方法
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申请号： US163507申请日： 1988-03-02
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公开(公告)号： US4855594A公开(公告)日： 1989-08-08
- 发明人: Fred M. Kimock , John H. Phillips
- 申请人： Fred M. Kimock , John H. Phillips
- 申请人地址： PA Allentown
- 专利权人： Air Products and Chemicals, Inc.
- 当前专利权人： Air Products and Chemicals, Inc.
- 当前专利权人地址： PA Allentown
- 主分类号： B01D59/44
- IPC分类号： B01D59/44 ; H01J49/16
摘要：
A system and method for detecting trace levels of a sample gas in a mass spectrometer having a vacuum chamber with a vacuum pump, an ionizer, extracting and imaging lens and a detector. A high pressure sample gas pulse is introduced into the vacuum chamber through a small orifice to produce a high density of sample gas in a region near the orifice. The density of the sample gas pulse is sufficient to substantially sweep residual background gas from the path of the pulse. A portion of the sample gas pulse is ionized and ions are extracted and imaged.
公开/授权文献
- US4363813A 2-(3,4,5-Trimethoxyphenyl)-4,5-disubstituted thiazoles 公开/授权日：1982-12-14
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