发明授权
US4865445A Apparatus for detecting faults on the surface of a resist master disc
and measuring the thickness of the resist coating layer
失效
用于检测抗蚀剂母盘表面上的故障并测量抗蚀剂涂层的厚度的装置
- 专利标题: Apparatus for detecting faults on the surface of a resist master disc and measuring the thickness of the resist coating layer
- 专利标题(中): 用于检测抗蚀剂母盘表面上的故障并测量抗蚀剂涂层的厚度的装置
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申请号: US94777申请日: 1987-09-10
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公开(公告)号: US4865445A公开(公告)日: 1989-09-12
- 发明人: Kazumi Kuriyama , Shigeru Kono , Yutaka Takasu , Chiharu Koshio , Kazuhiko Nagata
- 申请人: Kazumi Kuriyama , Shigeru Kono , Yutaka Takasu , Chiharu Koshio , Kazuhiko Nagata
- 申请人地址: JPX Tokyo
- 专利权人: Pioneer Electronic Corporation
- 当前专利权人: Pioneer Electronic Corporation
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX61-213345 19860910
- 主分类号: G01B11/06
- IPC分类号: G01B11/06 ; G01B11/30 ; G01N21/88 ; G01N21/95 ; G11B7/0037 ; G11B7/26
摘要:
An apparatus for detecting faults on the surface of a resist master disc and for measuring the thickness of the resist coating layer includes a single light source for generating a laser beam for inspection of the master disc, a first separator for separating the laser beam into a first laser beam which is used for the detection of faults, and a second laser beam which is used to measure the thickness of the resist coating layer. The second laser beam is further separated into two laser beams one of which is irradiated on the surface of the resist coated master disc at a given angle of incidence. The detection of faults on the surface of the master disc is performed by detecting a level change of the quantity of reflection light of the first laser beam from the resist master disc, and the measurement of the thickness of the resist layer is performed by using a ratio between quantities of two laser beams obtained from the second laser beam one of which is detected after being reflected by the surface of the resist master disc.
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