发明授权
- 专利标题: Process and device for measuring the optical properties of thin layers
- 专利标题(中): 用于测量薄层光学性能的方法和装置
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申请号: US881708申请日: 1986-07-03
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公开(公告)号: US4878755A公开(公告)日: 1989-11-07
- 发明人: Hans-Joachim Siegmund , Horst Schwiecker
- 申请人: Hans-Joachim Siegmund , Horst Schwiecker
- 申请人地址: DEX Hanau
- 专利权人: Leybold Aktiengesellschaft
- 当前专利权人: Leybold Aktiengesellschaft
- 当前专利权人地址: DEX Hanau
- 优先权: DEX3610733 19860329
- 主分类号: C23C14/54
- IPC分类号: C23C14/54 ; G01B11/06 ; G01N21/59 ; G01N21/84
摘要:
Process for measuring the optical properties of thin layers while they are being built up in vacuum coating installations. For this purpose, at least one test object is passed through a stationary measuring light beam and the transmission behavior of the test object is evaluated by measurement. A reference point for the measurements is fixed in each case by reference measurements at intervals of time. In addition, at least one opaque measurement zone and at least one measuring zone, which does not attenuate the measuring light beam, are disposed in path of motion of the test object. The ratio of the measured value of the test object, decreased by the measured value of the opaque measuring zone, to the measured value of the nonattenuating measuring zone, decreased by the measured value of the opaque measuring zone, is formed by an arithmetic logic unit.
公开/授权文献
- US5871098A Article holding tray 公开/授权日:1999-02-16
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