Invention Grant
- Patent Title: Process and device for measuring the optical properties of thin layers
- Patent Title (中): 用于测量薄层光学性能的方法和装置
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Application No.: US881708Application Date: 1986-07-03
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Publication No.: US4878755APublication Date: 1989-11-07
- Inventor: Hans-Joachim Siegmund , Horst Schwiecker
- Applicant: Hans-Joachim Siegmund , Horst Schwiecker
- Applicant Address: DEX Hanau
- Assignee: Leybold Aktiengesellschaft
- Current Assignee: Leybold Aktiengesellschaft
- Current Assignee Address: DEX Hanau
- Priority: DEX3610733 19860329
- Main IPC: C23C14/54
- IPC: C23C14/54 ; G01B11/06 ; G01N21/59 ; G01N21/84
Abstract:
Process for measuring the optical properties of thin layers while they are being built up in vacuum coating installations. For this purpose, at least one test object is passed through a stationary measuring light beam and the transmission behavior of the test object is evaluated by measurement. A reference point for the measurements is fixed in each case by reference measurements at intervals of time. In addition, at least one opaque measurement zone and at least one measuring zone, which does not attenuate the measuring light beam, are disposed in path of motion of the test object. The ratio of the measured value of the test object, decreased by the measured value of the opaque measuring zone, to the measured value of the nonattenuating measuring zone, decreased by the measured value of the opaque measuring zone, is formed by an arithmetic logic unit.
Public/Granted literature
- US5871098A Article holding tray Public/Granted day:1999-02-16
Information query
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