发明授权
- 专利标题： Method of mass analyzing a sample by use of a quistor
- 专利标题（中）： 通过使用电阻对样品进行质量分析的方法
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申请号： US265108申请日： 1988-10-31
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公开(公告)号： US4882484A公开(公告)日： 1989-11-21
- 发明人: Jochen Franzen , Reemt-Holger Gabling , Gerhard Heinen , Gerhard Weiss
- 申请人： Jochen Franzen , Reemt-Holger Gabling , Gerhard Heinen , Gerhard Weiss
- 申请人地址： DC Washington
- 专利权人： The United States of America as represented by the Secretary of the Army
- 当前专利权人： The United States of America as represented by the Secretary of the Army
- 当前专利权人地址： DC Washington
- 主分类号： H01J49/42
- IPC分类号： H01J49/42
摘要：
In a quadrupole ion store (QUISTOR), a sample is analyzed by increasing themplitude of the harmonic, or "secular", oscillations of selected stably trapped ions so that they leave the trapping field. In a preferred embodiment, deviations from the ideal electrode geometry are incorporated into the QUISTOR to produce resonance phenomena between the r and z secular oscillations, thereby increasing the amplitude of oscillations in the z direction.
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