发明授权
- 专利标题: Profilometry
- 专利标题(中): 轮廓测量
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申请号: US183933申请日: 1988-04-20
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公开(公告)号: US4888983A公开(公告)日: 1989-12-26
- 发明人: Lawrence G. Dunfield , Kar P. Lok
- 申请人: Lawrence G. Dunfield , Kar P. Lok
- 申请人地址: DEX Ludwigshafen
- 专利权人: BASF Aktiengesellschaft
- 当前专利权人: BASF Aktiengesellschaft
- 当前专利权人地址: DEX Ludwigshafen
- 主分类号: G01B7/34
- IPC分类号: G01B7/34 ; G01N33/34
摘要:
The properties, and particularly the print gloss, of coated, unprinted paper may be predicted using surface profilometry. The profilometer is preferably hand held so the contour of paper in jumbo rolls in the finishing and storage area may be determined quickly. The surface contour is then compared to a calibration curve to predict the desired property.
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