发明授权
- 专利标题: Particle analyzing apparatus
- 专利标题(中): 粒子分析仪
-
申请号: US165497申请日: 1988-03-08
-
公开(公告)号: US4893929A公开(公告)日: 1990-01-16
- 发明人: Moritoshi Miyamoto
- 申请人: Moritoshi Miyamoto
- 申请人地址: JPX Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX62-58301 19870313; JPX62-146656 19870612
- 主分类号: G01N15/02
- IPC分类号: G01N15/02 ; G01N15/14
摘要:
A particle analyzing apparatus is provided with applying means for applying a light beam to a particle to be examined, correcting means for multiplying the intensities of a plurality of components of scattered lights emitted from said particle to be examined which differ in scattering angle by a correction coefficient and adding them together, and operation means for calculating the particle diameter of said particle to be examined from the output value of said correcting means.
公开/授权文献
- US6085481A Grille for a door or window 公开/授权日:2000-07-11
信息查询