发明授权
US4920517A Semiconductor memory device having sub bit lines 失效
具有子位线的半导体存储器件

Semiconductor memory device having sub bit lines
摘要:
A dynamic random access memory which includes a memory cell array, sense amplifiers disposed at both side of the memory cell array, and sub bit lines coupled to the sense amplifiers. The sub bit lines are coupled to data busses through middle amplifiers. By use of such memory architecture, higher integration of DRAM can be realized. Also, handling of super large bit data more than 1024 bit becomes possible.
信息查询
0/0