发明授权
- 专利标题： Memory with function test of error detection/correction device
- 专利标题（中）： 具有误差检测/校正装置功能测试的存储器
-
申请号： US260021申请日： 1988-10-20
-
公开(公告)号： US4924465A公开(公告)日： 1990-05-08
- 发明人: Toshiyuki Matsubara , Shuzo Fujioka , Atsuo Yamaguchi , Kenichi Takahira , Shigeru Furuta , Takesi Inoue
- 申请人： Toshiyuki Matsubara , Shuzo Fujioka , Atsuo Yamaguchi , Kenichi Takahira , Shigeru Furuta , Takesi Inoue
- 申请人地址： JPX
- 专利权人： Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人： Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人地址： JPX
- 优先权： JPX63-160744 19880630
- 主分类号： G06F12/16
- IPC分类号： G06F12/16 ; G06F11/10 ; G06F11/267
摘要：
A memory device for detecting and correcting errors in stored data includes a circuit for generating an error-detection/correction code with respect to data to be stored, a memory cell array in which the data and the error-detection/correction code are stored, an error-detection/correction circuit for detecting and corrrecting errors in the data by using the error-detection/correction code when the data is read out of the memory cell array, and a function test circuit selectively and directly connected to the error-detection/correction circuit for testing the error-detection/correction circuit.
公开/授权文献
- US4353362A Knee braces 公开/授权日：1982-10-12
信息查询
