发明授权
US4957363A Apparatus for measuring characteristics of particles in fluid by
detecting light scattered at the particles
失效
用于通过检测在颗粒处散射的光来测量流体中颗粒的特性的装置
- 专利标题： Apparatus for measuring characteristics of particles in fluid by detecting light scattered at the particles
- 专利标题（中）： 用于通过检测在颗粒处散射的光来测量流体中颗粒的特性的装置
-
申请号： US214515申请日： 1988-07-01
-
公开(公告)号： US4957363A公开(公告)日： 1990-09-18
- 发明人: Kazuo Takeda , Yoshitoshi Ito
- 申请人： Kazuo Takeda , Yoshitoshi Ito
- 申请人地址： JPX Tokyo
- 专利权人： Hitachi, Ltd.
- 当前专利权人： Hitachi, Ltd.
- 当前专利权人地址： JPX Tokyo
- 优先权： JPX62-165176 19870703
- 主分类号： G01N15/14
- IPC分类号： G01N15/14 ; G01N21/53
摘要：
In a particle measuring apparatus for measuring characteristics of particles by detecting light scattered at the particles while irradiating the particles in fluid with light, the scattered light is detected by means of a plurality of detectors and the characteristics of particles are determined by using pulse signals of detection signals coming from the plurality of detectors, which are coincident with each other.
公开/授权文献
信息查询
