发明授权
- 专利标题： Semiconductor device with current detecting function
- 专利标题（中）： 具有电流检测功能的半导体器件
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申请号： US307177申请日： 1989-02-03
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公开(公告)号： US4962411A公开(公告)日： 1990-10-09
- 发明人: Norihito Tokura , Hironari Kuno , Hiroyasu Ito , Hirohiko Saito , Kunihiko Hara
- 申请人： Norihito Tokura , Hironari Kuno , Hiroyasu Ito , Hirohiko Saito , Kunihiko Hara
- 申请人地址： JPX Kariya
- 专利权人： Nippondenso Co., Ltd.
- 当前专利权人： Nippondenso Co., Ltd.
- 当前专利权人地址： JPX Kariya
- 优先权： JPX60-64511 19860321; JPX61-26969 19870206
- 主分类号： H01L27/02
- IPC分类号： H01L27/02 ; H01L29/78
摘要：
A semiconductor device with a current detecting function in which in place of an external resistor for detecting an operation current such as drain current or collector current of a device such as an FET or bipolar transistor, a probe electrode is formed in proximity to the device depletion layer to connect therethrough with the device channel to generate a probe voltage corresponding to the operation current.
公开/授权文献
- US6146415A Stent delivery system 公开/授权日：2000-11-14
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