发明授权
US4999510A Apparatus for detecting foreign particles on a surface of a reticle or
pellicle
失效
用于检测掩模版或防护薄膜组件表面上的异物的装置
- 专利标题: Apparatus for detecting foreign particles on a surface of a reticle or pellicle
- 专利标题(中): 用于检测掩模版或防护薄膜组件表面上的异物的装置
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申请号: US427365申请日: 1989-10-27
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公开(公告)号: US4999510A公开(公告)日: 1991-03-12
- 发明人: Fuminori Hayano , Kazunori Imamura , Sunao Murata , Kinya Kato
- 申请人: Fuminori Hayano , Kazunori Imamura , Sunao Murata , Kinya Kato
- 申请人地址: JPX Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX62-17155 19870129; JPX62-42247 19870225; JPX62-115649 19870512; JPX62-119079 19870518
- 主分类号: G01N21/94
- IPC分类号: G01N21/94 ; G03F1/62 ; G03F1/84
摘要:
An apparatus for detecting foreign particles on a surface of a reticle or pellicle comprises an optical system through which a light beam forms a light spot on the surface. The surface and the light spot are shifted relatively so that the light spot scans the surface. Light detectors receive light scattered by a foreign particle and directed in different directions, respectively, and generated photoelectric outputs by which the presence of the foreign particle is discriminated. Beam diameter and scanning speed are varied to provide the most effective operation for particles of different sizes.
公开/授权文献
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