发明授权
US5001604A Embedded testing circuit and method for fabricating same 失效
嵌入式测试电路及其制造方法

Embedded testing circuit and method for fabricating same
摘要:
An improved structure for testing the operability of a completed circuit board having components thereon and improved method of fabricating same are disclosed. The structure and process include the use of an insulator portion with a printed circuit board adhered thereto which includes a testing pattern to evaluate the operability of a completed printed circuit board. The insulator portion which provides support for the test pattern extends past the edge of the printed circuit board thereby permitting one to test the operability of the printed circuit board without having to utilize valuable space and contact points on the printed board itself to test the operability of the completed printed circuit board once components have been installed.
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