发明授权
- 专利标题: Embedded testing circuit and method for fabricating same
- 专利标题(中): 嵌入式测试电路及其制造方法
-
申请号: US427753申请日: 1989-10-26
-
公开(公告)号: US5001604A公开(公告)日: 1991-03-19
- 发明人: W. Randolph Lusby
- 申请人: W. Randolph Lusby
- 专利权人: Compaq Computer Corp
- 当前专利权人: Compaq Computer Corp
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; H01K3/06 ; H01R12/04 ; H05K1/02 ; H05K1/11 ; H05K3/00
摘要:
An improved structure for testing the operability of a completed circuit board having components thereon and improved method of fabricating same are disclosed. The structure and process include the use of an insulator portion with a printed circuit board adhered thereto which includes a testing pattern to evaluate the operability of a completed printed circuit board. The insulator portion which provides support for the test pattern extends past the edge of the printed circuit board thereby permitting one to test the operability of the printed circuit board without having to utilize valuable space and contact points on the printed board itself to test the operability of the completed printed circuit board once components have been installed.
公开/授权文献
- US5615447A Portable cleaning container having foot activated drain 公开/授权日:1997-04-01
信息查询