发明授权
US5004904A Method and system for controlling gain and offset in radiation
measurement apparatus
失效
用于控制辐射测量装置中增益和偏移的方法和系统
- 专利标题: Method and system for controlling gain and offset in radiation measurement apparatus
- 专利标题(中): 用于控制辐射测量装置中增益和偏移的方法和系统
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申请号: US365385申请日: 1989-06-13
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公开(公告)号: US5004904A公开(公告)日: 1991-04-02
- 发明人: Tsutomu Yamakawa , Hiroaki Kobayashi
- 申请人: Tsutomu Yamakawa , Hiroaki Kobayashi
- 申请人地址: JPX Kawasaki
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX63-150913 19880617; JPX63-150914 19880617; JPX63-206081 19880819; JPX63-206082 19880819; JPX63-218920 19880831
- 主分类号: G01J1/08
- IPC分类号: G01J1/08 ; G01J1/18 ; G01J1/44 ; G01T1/208
摘要:
A measurement of standard light is performed during radiation measurement for gain correction and offset correction of radiation measurement apparatus. The standard light emitted by a LED falls on a PMT. An output signal of a preamplifier corresponding to the PMT is entered into a system controller after being subjected to predetermined analog signal processing. The system controller calculates a gain correction value and an offset correction value on the basis of initial correction values and an output value of the preamplifier, whereby gain control and offset control can be performed stably even in radiation measurement.
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