发明授权
- 专利标题: Photoelectron microscope
- 专利标题(中): 光电子显微镜
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申请号: US494443申请日: 1990-03-16
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公开(公告)号: US5045696A公开(公告)日: 1991-09-03
- 发明人: Hideo Hirose
- 申请人: Hideo Hirose
- 申请人地址: JPX Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JPX Kyoto
- 优先权: JPX1-82462 19890331; JPX1-219473 19890825
- 主分类号: G01Q30/02
- IPC分类号: G01Q30/02 ; G01Q30/18 ; G01Q30/20 ; G21K7/00 ; H01J31/50 ; H01J37/285
摘要:
A photoelectron microscope wherein a normal conductive coil is used to produce a divergent magnetic field to form an enlarged photoelectron image of a specimen to be examined. The coil is only momentarily energized by pulse current, and in synchronism with the energization of the coil and while the change of the resultant magnetic field with time is small, the radiation source is actuated to produce a radiation pulse so that the photoelectrons produced upon irradiation of a specimen with the pulse flies through the magnetic field so as to be received by an image forming device. The image forming device is operated in synchronism with and a predetermined variable period of time after the actuation of the radiation source thereby to obtain photoelectron images of the specimen of different energy levels. By skimming only those photoelectrons of low energy which are emitted close to the axis of the magnetic field, it is possible to obtain images of high resolution.
公开/授权文献
- US5611830A Air filter having pockets, and method of assembly thereof 公开/授权日:1997-03-18
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