发明授权
- 专利标题: Laser systems for material analysis based on reflectance ratio detection
- 专利标题(中): 基于反射率检测的材料分析激光系统
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申请号: US474344申请日: 1990-02-02
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公开(公告)号: US5054487A公开(公告)日: 1991-10-08
- 发明人: Richard H. Clarke
- 申请人: Richard H. Clarke
- 申请人地址: MA Boston
- 专利权人: Boston Advanced Technologies, Inc.
- 当前专利权人: Boston Advanced Technologies, Inc.
- 当前专利权人地址: MA Boston
- 主分类号: A61B5/00
- IPC分类号: A61B5/00
摘要:
Systems and methods for non-invasive material analysis are disclosed in which a material (e.g., a liquid such as blood) is illuminated at a plurality of discrete wavelengths. Measurements of the intensity of reflected light at such wavelengths are taken, and an analysis of reflection ratios for various wavelengths is performed. Changes in the reflection ratios can be correlated with specific material properties such as the concentration of analytes (e.g., oxygen content, glucose levels, cholesterol or drugs in a subject's circulatory system).
公开/授权文献
- US5626202A Push clip fastener with retention tabs 公开/授权日:1997-05-06