发明授权
- 专利标题: Method and apparatus for inspecting quality of manufactured articles
- 专利标题(中): 用于检查制品质量的方法和装置
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申请号: US476725申请日: 1990-02-08
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公开(公告)号: US5085515A公开(公告)日: 1992-02-04
- 发明人: Hajime Itoh , Atsuo Itow , Yoshihiro Inoue , Hiroshi Ishizaki
- 申请人: Hajime Itoh , Atsuo Itow , Yoshihiro Inoue , Hiroshi Ishizaki
- 申请人地址: JPX Tokyo
- 专利权人: Mitsubishi Metal Corporation
- 当前专利权人: Mitsubishi Metal Corporation
- 当前专利权人地址: JPX Tokyo
- 主分类号: B07C5/34
- IPC分类号: B07C5/34
摘要:
There is disclosed a method for inspecting a physical feature on a surface of a manufactured article. First, a sensor is provided adjacent to the article. Then, the surface of the article is sensed by the sensor while causing one of the sensor and the article to rotate about an axis perpendicular to the surface of the article, to thereby obtain a signal which has peaks corresponding to the physical feature on the surface of the article. Subsequently the signal is processed and the processed signal is analyzed based on the number of the peaks, to thereby obtain information as to the physical feature on the surface of the article. An inspection apparatus suitable for practicing the above-mentioned method is also disclosed.
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