发明授权
- 专利标题: Measuring device in a scanning probe microscope
- 专利标题(中): 扫描探针显微镜中的测量装置
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申请号: US730475申请日: 1991-07-16
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公开(公告)号: US5136162A公开(公告)日: 1992-08-04
- 发明人: Hirofumi Miyamoto , Tsugiko Takase , Hiroshi Kajimura , Akitoshi Toda
- 申请人: Hirofumi Miyamoto , Tsugiko Takase , Hiroshi Kajimura , Akitoshi Toda
- 申请人地址: JPX Tokyo
- 专利权人: Olympus Optical Co., Ltd.
- 当前专利权人: Olympus Optical Co., Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX2-198593 19900726
- 主分类号: G01B7/34
- IPC分类号: G01B7/34 ; G01N37/00 ; G01Q30/18 ; G01Q60/10 ; G01Q70/08 ; G05D3/12 ; H01J37/252 ; H01J37/26 ; H01J37/28 ; H01L41/09
摘要:
A probe for scanning a sample is attached to a probe electrode supported by a cylindrical piezoelectric actuator. The actuator has four drive electrodes on its periphery, and deforms in the three axial directions in accordance with the voltage applied to the drive electrodes. A girdling electrode is provided between the actuator and the probe electrode. The girdling electrode is insulated from the probe electrode and the drive electrodes by insulator members provided on its upper and lower surfaces. A bias voltage signal S1 is input to an operational amplifier of which the output is connected to the girdling electrode. The amplifier is a voltage follower for equalizing the potential of the girdling electrode to that of the bias voltage signal S1. An operational amplifier has a non-inversion input to which the bias voltage signal S1 is input, and an inversion input connected to the probe electrode. While equalizing the potential of the probe electrode to that of the bias input voltage S1, the amplifier converts a tunnel current flowing between the probe and the sample to a voltage signal S2. An operational amplifier subtracts a bias voltage component from the voltage signal S2, and outputs a tunnel current signal S3.
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