发明授权
US5146170A Method and apparatus for locating an abnormality in a gas-insulated
electric device
失效
在气体绝缘电气设备中定位异常的方法和装置
- 专利标题: Method and apparatus for locating an abnormality in a gas-insulated electric device
- 专利标题(中): 在气体绝缘电气设备中定位异常的方法和装置
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申请号: US535069申请日: 1990-06-08
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公开(公告)号: US5146170A公开(公告)日: 1992-09-08
- 发明人: Toshio Ishikawa , Shuzuo Iwaasa , Tomoaki Utsumi , Fumihiro Endo
- 申请人: Toshio Ishikawa , Shuzuo Iwaasa , Tomoaki Utsumi , Fumihiro Endo
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX1-149428 19890614
- 主分类号: G01R31/08
- IPC分类号: G01R31/08 ; G01R31/12 ; H02B13/065 ; H02G5/06
摘要:
A method and apparatus for locating an abnormality in a gas-insulated electric device, operative to locate the spot of an insulation abnormality, which emerges inside a metallic container, from outside of said metallic container. A plurality of detectors (S.sub.0 -S.sub.n) disposed at certain positions in the metallic container produce detected signals, from which spectrum strengths (YH) in a high frequency band of 500 MHz or above are evaluated, and a position which renders a maximum spectrum strength is calculated from the relation between the spectrum strengths and the installation positions of the detectors and is determined to be the spot (x) of partial discharge.
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