发明授权
- 专利标题: Resist composition and pattern formation process
- 专利标题(中): 耐蚀组合物和图案形成过程
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申请号: US667897申请日: 1991-03-12
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公开(公告)号: US5153103A公开(公告)日: 1992-10-06
- 发明人: Akiko Kotachi , Satoshi Takechi
- 申请人: Akiko Kotachi , Satoshi Takechi
- 申请人地址: JPX Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX2-061552 19900313
- 主分类号: C08F20/02
- IPC分类号: C08F20/02 ; C08F20/22 ; C08F20/52 ; C08F30/08 ; C08F220/02 ; C08F220/22 ; C08F220/56 ; C08F220/58 ; C08F230/08 ; G03F7/004 ; G03F7/075 ; G03F7/26 ; H01L21/027 ; H01L21/30 ; H01L21/3213
摘要:
A high energy radiation-sensitive, pattern-forming resist composition comprising a polymer of the formula (I): ##STR1## in which R.sub.1 represents an alkyl groups, cyano group, --CH.sub.2 OH or --CH.sub.2 CO.sub.2 R wherein R represents an alkyl group, R.sub.2 represents a hydrocarbon group containing at least one silicon atom, R.sub.3 represents a group capable of causing crosslinking of the polymer upon application of heat, and m and n each is an integer. The resist composition is particularly useful as a top layer resist of the bi-level resist system, and the exposed top layer resist can be stably developed because of a remarkably increased difference of the solubility in the developer of the exposed and unexposed areas thereof.
公开/授权文献
- US5704037A Cursor positioning device for computer system 公开/授权日:1997-12-30
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