发明授权
US5187545A Integrated optical position measuring device and method with reference and measurement signals 失效
集成光学位置测量装置和方法与参考和测量信号

  • 专利标题: Integrated optical position measuring device and method with reference and measurement signals
  • 专利标题(中): 集成光学位置测量装置和方法与参考和测量信号
  • 申请号: US629842
    申请日: 1990-12-19
  • 公开(公告)号: US5187545A
    公开(公告)日: 1993-02-16
  • 发明人: Michael Allgauer
  • 申请人: Michael Allgauer
  • 申请人地址: DEX Traunreut
  • 专利权人: Dr. Johannes Heidenhain GmbH
  • 当前专利权人: Dr. Johannes Heidenhain GmbH
  • 当前专利权人地址: DEX Traunreut
  • 优先权: EPX89123897.4 19891223
  • 主分类号: G01B9/02
  • IPC分类号: G01B9/02
Integrated optical position measuring device and method with reference
and measurement signals
摘要:
A position measuring apparatus for measuring the position of an object having an integrated optical circuit on a substrate comprising a first grating for diffracting a light beam into a reference bundle and a measuring bundle. The first grating couples the reference bundle to an input of a coupler and decouples the measuring bundle from the substrate. The measuring bundle is directed to a reflecting element on the object wherein the measuring bundle is reflected from the object. The coupler has means for inputting signals and for outputting signals wherein the input signals are brought into interference. A second grating couples the reflected measuring bundle to another input of the coupler. Detection means detect the outputs of the coupler and generate phase displaced signals representative of the outputs.
信息查询
0/0