发明授权
- 专利标题: LSI cooling apparatus and computer cooling apparatus
- 专利标题(中): LSI冷却装置和计算机冷却装置
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申请号: US659671申请日: 1991-02-25
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公开(公告)号: US5195576A公开(公告)日: 1993-03-23
- 发明人: Toshio Hatada , Hitoshi Matsushima , Yoshihiro Kondou , Hiroshi Inoue , Kanji Otsuka , Yuji Shirai , Takao Ohba , Akira Yamagiwa
- 申请人: Toshio Hatada , Hitoshi Matsushima , Yoshihiro Kondou , Hiroshi Inoue , Kanji Otsuka , Yuji Shirai , Takao Ohba , Akira Yamagiwa
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX2-45413 19900228
- 主分类号: H01L23/473
- IPC分类号: H01L23/473 ; F28F3/02 ; H01L23/367 ; H01L23/467 ; H05K7/10 ; H05K7/20
摘要:
An LSI cooling apparatus having various structures is used in electronic devices such as computer systems. In particular, the LSI cooling of apparatus is suitable for cooling of LSIs having high heat generating densities. In a cooling apparatus of the present invention, a heat sink is constructed to be small in pressure loss and excellent in cooling performance. This is because the heat sink comprises thin wire fins so set that the Reynold's number may not exceed 40. As a result, LSIs generating a large amount of heat can be cooled. Further, a heat sink having rigidity can be obtained by disposing wide-width wire drawn substances in thin wires or by using supports. Further, a computer comprising LSIs equipped with heat sinks can cope with various cooling air sending methods and it can be cooled with low noises.
公开/授权文献
- US5977781A Capacitive measuring device 公开/授权日:1999-11-02
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