发明授权
- 专利标题: High sensitive element analyzing method and apparatus of the same
- 专利标题(中): 高灵敏度元素分析方法及装置
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申请号: US724179申请日: 1991-07-01
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公开(公告)号: US5202562A公开(公告)日: 1993-04-13
- 发明人: Masataka Koga , Toyoharu Okumoto , Masatoshi Kitagawa , Masamichi Tsukada , Yukio Okamoto
- 申请人: Masataka Koga , Toyoharu Okumoto , Masatoshi Kitagawa , Masamichi Tsukada , Yukio Okamoto
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX2-178675 19900706
- 主分类号: G01N27/62
- IPC分类号: G01N27/62 ; H01J37/244 ; H01J49/04 ; H01J49/26
摘要:
A standard containing the same elements as a sample is prepared. Concentrations of the elements of the standard are known previously. When signal intensities of an element of the standard solution and the sample exceed an upper limit of a pulse counter of an element analyzing apparatus, a transmitting rate of a passage, through which ionized elements of the standard and the sample pass, is controlled to be less than the ordinal transmitting rate of the passage in synchronism to the passing time of the elements. The concentrations of the elements of the sample is calculated based on output signals of the pulse counter concerning the elements of the standard and the sample and known concentration of the standard.
公开/授权文献
- US6003122A Direct memory access controller 公开/授权日:1999-12-14
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