发明授权
- 专利标题: Method and apparatus of detecting deviation of scanning line of light beam
- 专利标题(中): 检测光束扫描线偏差的方法和装置
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申请号: US901666申请日: 1992-06-22
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公开(公告)号: US5245181A公开(公告)日: 1993-09-14
- 发明人: Masamichi Cho
- 申请人: Masamichi Cho
- 申请人地址: JPX
- 专利权人: Dainippon Screen Mfg. Co., Ltd.
- 当前专利权人: Dainippon Screen Mfg. Co., Ltd.
- 当前专利权人地址: JPX
- 优先权: JPX3-180116 19910624
- 主分类号: G02B26/10
- IPC分类号: G02B26/10 ; B41J2/44 ; H04N1/047 ; H04N1/113 ; H04N1/12
摘要:
Beam position sensors detect deviations of a light beam from target positions defined at both sides of a recording drum. Predicted total deviations of light beam from the target positions are calculated as a function of beam position signals detected by the beam position sensors. A piezoelectric element of a sub-deflector is actuated in response to the predicted total deviations. The light beam deflected by a main deflector scans the target positions on a recording medium.
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