Invention Grant
- Patent Title: Method for the hierarchical comparison of schematics and layouts of electronic components
- Patent Title (中): 电子元件原理图和布局分层比较的方法
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Application No.: US684047Application Date: 1991-04-10
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Publication No.: US5249133APublication Date: 1993-09-28
- Inventor: Pradeep Batra
- Applicant: Pradeep Batra
- Applicant Address: CA Mountain View
- Assignee: Sun Microsystems, Inc.
- Current Assignee: Sun Microsystems, Inc.
- Current Assignee Address: CA Mountain View
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
The present invention takes advantage of the hierarchical nature of the design to perform a hierarchical comparison on as many blocks and sub-blocks which can be matched between the layout and the logic design. Because the internal connections were previously verified when the first occurrence of the block was compared, repetition of lengthy comparisons of multiple occurrences of the same blocks in the designs is avoided and subsequent comparisons are performed simply by comparing the input and output connections to the block.
Public/Granted literature
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