发明授权
US5272098A Vertical and lateral insulated-gate, field-effect transistors, systems
and methods
失效
垂直和横向绝缘栅,场效应晶体管,系统和方法
- 专利标题: Vertical and lateral insulated-gate, field-effect transistors, systems and methods
- 专利标题(中): 垂直和横向绝缘栅,场效应晶体管,系统和方法
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申请号: US952220申请日: 1992-09-28
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公开(公告)号: US5272098A公开(公告)日: 1993-12-21
- 发明人: Michael C. Smayling , James R. Todd , Louis Hutter
- 申请人: Michael C. Smayling , James R. Todd , Louis Hutter
- 申请人地址: TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: TX Dallas
- 主分类号: H01L21/336
- IPC分类号: H01L21/336 ; H01L21/8234 ; H01L29/78 ; H01L29/788 ; H01L21/265
摘要:
A field effect transistor (147) is formed in a region of a second semiconductor layer (171), having a first conductivity type. A tank region (196) of a second conductivity type opposite the first conductivity type is formed in the semiconductor region (171), and defines a tank area on the face of the semiconductor layer (171). A first highly doped region (276) formed to be of the first conductivity type is formed within the region (171) and to be spaced from the tank region (196). A gate insulator layer (218) is formed on at least one selected portion of the face, this selected portion including a portion of the tank area (196). A conductive gate (246) is formed on the gate insulator layer over the selected portion of the face. At least one second highly doped region (278) is formed at the face within the tank area to be of the first conductivity type, and to have at least one lateral edge self-aligned to a corresponding one of the lateral edges of the gate (246 ). The tank area forms a channel between the first highly doped region (276) and the second highly doped region (278).
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