Invention Grant
- Patent Title: Semiconductor device for improving high-frequency characteristics and avoiding chip cracking
- Patent Title (中): 用于提高高频特性并避免芯片开裂的半导体器件
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Application No.: US817073Application Date: 1992-01-06
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Publication No.: US5287072APublication Date: 1994-02-15
- Inventor: Masakazu Kojima , Yoshio Aoki , Seigo Sano
- Applicant: Masakazu Kojima , Yoshio Aoki , Seigo Sano
- Applicant Address: JPX Kawasaki JPX Yamanashi
- Assignee: Fujitsu Limited,Fujitsu Yamanashi Electronics Limited
- Current Assignee: Fujitsu Limited,Fujitsu Yamanashi Electronics Limited
- Current Assignee Address: JPX Kawasaki JPX Yamanashi
- Priority: JPX3-001651 19910110
- Main IPC: H01L21/3205
- IPC: H01L21/3205 ; H01L21/338 ; H01L23/52 ; H01L29/417 ; H01L29/423 ; H01L29/812 ; H03F3/60
Abstract:
A semiconductor device comprises a plurality of gate electrodes, drain electrodes, and source electrodes axi-symmetrically formed on opposite sides of a gate pad and drain pad. Two source pads are arranged at ends of these electrodes, to which the source electrodes are connected, so that a gate width can be shortened. Therefore, an output power, gain, etc., can be increased, and the high-frequency characteristics can be improved. Further, when arranging a plurality of semiconductor devices in parallel, the semiconductor chip can be formed in the shape of a square, i.e., the aspect ratio thereof can be reduced, and therefore, cracks in the semiconductor chip (semiconductor device) can be avoided.
Public/Granted literature
- US5983072A Establishing a telecommunications connection in a mobile communication system Public/Granted day:1999-11-09
Information query
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