发明授权
US5298746A Method and device for control of the excitation voltage for ion ejection
from ion trap mass spectrometers
失效
用于控制从离子阱质谱仪离子喷射的激发电压的方法和装置
- 专利标题： Method and device for control of the excitation voltage for ion ejection from ion trap mass spectrometers
- 专利标题（中）： 用于控制从离子阱质谱仪离子喷射的激发电压的方法和装置
-
申请号： US997284申请日： 1992-12-23
-
公开(公告)号： US5298746A公开(公告)日： 1994-03-29
- 发明人: Jochen Franzen , Reemt-Holger Gabling
- 申请人： Jochen Franzen , Reemt-Holger Gabling
- 申请人地址： DEX Bremen
- 专利权人： Bruker-Franzen Analytik GmbH
- 当前专利权人： Bruker-Franzen Analytik GmbH
- 当前专利权人地址： DEX Bremen
- 优先权： DEX4142869 19911223
- 主分类号： H01J49/42
- IPC分类号： H01J49/42
摘要：
An improved scanning method used in an ion trap mass spectrometer comprises controlling the amplitude of the excitation RF during the mass scan to produce a smooth, nonlinear, highly suitable function. A smooth function is a function with a steady derivative. According to one embodiment of the invention, the excitation amplitude is set proportionally to the square root of the storage amplitude, thus making the excitation amplitude proportional to the root of the mass number.