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US5299161A Method and device for improving performance of a parallel write test of a semiconductor memory device 失效
一种用于提高半导体存储器件的并行写入测试性能的方法和装置

Method and device for improving performance of a parallel write test of a semiconductor memory device
摘要：
A semiconductor memory device having normal columns and redundant columns includes normal column decoders for designating the normal columns and redundant column decoders for designating the redundant columns so that the bits from the normal columns are combined with the bits from the redundant columns so as to provide an entire byte. The normal column decoders are to be operated simultaneously with the redundant column decoders.
摘要（中）：

具有正常列和冗余列的半导体存储器件包括用于指定标准列的正常列解码器和用于指定冗余列的冗余列解码器，使得来自正常列的位与来自冗余列的位组合，以便提供 整个字节。 正常列解码器将与冗余列解码器同时操作。

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