发明授权
US5303191A Memory with compensation for voltage, temperature, and processing
variations
失效
具有电压,温度和加工变化补偿的存储器
- 专利标题: Memory with compensation for voltage, temperature, and processing variations
- 专利标题(中): 具有电压,温度和加工变化补偿的存储器
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申请号: US824666申请日: 1992-01-23
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公开(公告)号: US5303191A公开(公告)日: 1994-04-12
- 发明人: John W. Eagan , Scott G. Nogle , Ruey J. Yu
- 申请人: John W. Eagan , Scott G. Nogle , Ruey J. Yu
- 申请人地址: IL Schaumburg
- 专利权人: Motorola, Inc.
- 当前专利权人: Motorola, Inc.
- 当前专利权人地址: IL Schaumburg
- 主分类号: G11C11/413
- IPC分类号: G11C11/413 ; G11C7/10 ; G11C8/06 ; G11C11/407 ; G11C11/408 ; G11C11/417 ; G11C13/00
摘要:
A memory (30) includes input buffers (35, 38, 56), decoders (31, 32, 36), and a memory portion (34). The input buffers (35, 38, 56) include a delay circuit (82) which delays at least one transition of an input signal. The delay circuit (82) includes a compensation circuit (250) which compensates the delay circuit (82) for voltage, temperature, and processing variations. In one embodiment, the delay circuit (82) includes a CMOS inverter (102, 103) with an additional transistor (101) coupled between a source of an inverter transistor (102) and a corresponding power supply voltage. The compensation circuit (250) provides a bias voltage to bias a gate of the transistor (101) to determine the delay of the delay circuit (82). The compensation circuit (250) provides the bias voltage as that voltage which biases the transistor (101) to conduct a precision reference current.
公开/授权文献
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