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US5304923A Integrated circuit device having signal discrimination circuit and method of testing the same 失效
具有信号鉴别电路的集成电路装置及其测试方法

Integrated circuit device having signal discrimination circuit and
method of testing the same
摘要:
An integrated circuit device formed on a chip includes a pair of signal input terminals, a signal discriminating circuit having a pair of input terminals coupled to the signal input terminals, for comparing a data signal and a reference signal supplied through the input terminals and for determining whether or not the level of said data signal is higher than that of said reference signal, a pair of test signal terminals to which a predetermined voltage is applied, and a voltage dividing circuit for dividing the predetermined voltage to thereby generate a test signal to be supplied to the signal discriminating circuit through the input terminals.
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