发明授权
- 专利标题: Plasma source for etching
- 专利标题(中): 用于蚀刻的等离子体源
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申请号: US805864申请日: 1991-12-10
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公开(公告)号: US5330606A公开(公告)日: 1994-07-19
- 发明人: Masafumi Kubota , Noboru Nomura , Tokuhiko Tamaki
- 申请人: Masafumi Kubota , Noboru Nomura , Tokuhiko Tamaki
- 申请人地址: JPX Kadoma
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JPX Kadoma
- 优先权: JPX2-402319 19901214; JPX3-30019 19910225
- 主分类号: H01J37/32
- IPC分类号: H01J37/32 ; H01L21/00
摘要:
An apparatus for generating plasma is disclosed. The apparatus comprises: a plasma chamber; pairs of parallel plate electrodes; and a power supply for applying high-frequency powers on the pairs of electrodes. The frequencies of the high-frequency powers and the phase difference between the high-frequency powers are adjusted so as to cause each of electrons in the plasma to move in a circular path. A dense and highly uniform plasma is generated at a low pressure level, by utilizing the phenomenon of the oscillation, revolution or cycloidal motion of electrons in a high-frequency electric field formed between the parallel plate electrodes. This plasma is suitable for etching in the LSI fabrication process.
公开/授权文献
- US5712511A Preparation of fine particulate CL-20 公开/授权日:1998-01-27
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