A resistance probe is proposed for detecting gas compositions, particularly in the exhaust gases of internal combustion engines. This resistance probe has the advantage over prior art resistance probes that, with a short response time, it is considerably more aging resistant. This is accomplished in that the resistance layer configured as a semiconductor layer is introduced or sintered into recesses or slits provided for this purpose in the prefabricated sensor carrier body and above it is applied a porous, electrically non-conductive engobe or a protective layer structure in the form of a grid or raster. These measures enable the measuring gas to gain access to the semiconductor layer, but the semiconductor layer is simultaneously protected against corrosive, erosive and/or cavitative attacks from the exhaust gas.