发明授权
- 专利标题: Thin film transistor substrate, liquid crystal display panel and liquid crystal display equipment
- 专利标题(中): 薄膜晶体管基板,液晶显示面板和液晶显示设备
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申请号: US674328申请日: 1991-04-15
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公开(公告)号: US5359206A公开(公告)日: 1994-10-25
- 发明人: Hideaki Yamamoto , Haruo Matsumaru , Yasuo Tanaka , Ken Tsutsui , Toshihisa Tsukada , Kazuo Shirahashi , Akira Sasano , Yuka Matsukawa
- 申请人: Hideaki Yamamoto , Haruo Matsumaru , Yasuo Tanaka , Ken Tsutsui , Toshihisa Tsukada , Kazuo Shirahashi , Akira Sasano , Yuka Matsukawa
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX1-207792 19890814; JPX1-302120 19891122; JPX1-302122 19891122
- 主分类号: G02F1/1343
- IPC分类号: G02F1/1343 ; G02F1/1345 ; G02F1/136 ; G02F1/1362 ; G02F1/1368 ; G09F9/30 ; G09G3/36 ; H01L21/3205 ; H01L21/336 ; H01L27/12 ; H01L29/49 ; H01L29/78 ; H01L29/786 ; H01L29/04 ; H01L23/48 ; H01L27/01 ; H01L31/036
摘要:
Disclosed is an active-matrix addressed TFT substrate using a thin film transistor, a manufacturing method and an anodic oxidation method thereof, a liquid crystal display panel using the TFT substrate and a liquid crystal display equipment using the liquid crystal display panel. In the TFT substrate, Cr or Ta is used for gate terminals, aluminum or a metal mainly composed of aluminum is used for gate bus-lines extending therefrom, for gate electrodes, and for electrodes of thin film capacitors (additional capacitance, storage capacitance), and an anodic oxidized film composed of the metal and free from defect is used for at least one of gate insulators, dielectric films of the thin film capacitances and interlayer insulating films for the intersections between the bus-lines. Also disclosed is a method of selectively forming an anodic oxidized film on an aluminum pattern. That is, in a case of forming a selective oxidation mask to a desired region on the aluminum pattern with a positive type photoresist, in the present invention, an angle (.theta.) formed between the selective oxidation mask and the aluminum pattern is made as: .theta..gtoreq.110-20T (T: film thickness of the positive type photoresist).
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