发明授权
- 专利标题: Charged particle beam apparatus and it's operating method
- 专利标题(中): 带电粒子束装置及其操作方法
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申请号: US69573申请日: 1993-06-01
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公开(公告)号: US5393977A公开(公告)日: 1995-02-28
- 发明人: Akimitsu Okura , Mitsugu Sato , Osamu Yamada , Yasushi Nakaizumi , Eiichi Hazaki
- 申请人: Akimitsu Okura , Mitsugu Sato , Osamu Yamada , Yasushi Nakaizumi , Eiichi Hazaki
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX4-166720 19920603
- 主分类号: H01J37/22
- IPC分类号: H01J37/22 ; G01Q30/02 ; G01Q30/04 ; G01Q60/10 ; H01J37/252 ; H01J37/26 ; H01J37/28
摘要:
A specimen is scanned with an electron beam so as to generate a signal characteristic of the specimen to thereby produce an image thereof on the basis of the generated signal. A memory is provided for storing operating conditions of a scanning electron microscope which are associated with identification information for specifying the specimen. The identification information is designated so that thereby at least one operating condition corresponding to the designated identification information is read out from the memory, and the read out operating condition is automatically set so that the scanning electron microscope is operated under the set operating condition.
公开/授权文献
- USD399079S Adjustable support 公开/授权日:1998-10-06
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