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US5409848A Angled lateral pocket implants on p-type semiconductor devices 失效
p型半导体器件上的倾斜侧向袋植入

Angled lateral pocket implants on p-type semiconductor devices
Abstract:
The punchthrough capacity of a p-type semiconductor device is significantly improved by nonuniformly doping the p-channel with n-type implants such as phosphorus. The n-type dopants are implanted at large angles to form pocket implants within the channel region. The dose of the implants, angle of the implants and the thermal cycle annealing of the implants will be optimized for maximum punchthrough capability without substantially detracting from the performance of the semiconductor device.
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