发明授权
- 专利标题： Off-axis interface for a mass spectrometer
- 专利标题（中）： 用于质谱仪的离轴界面
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申请号： US142359申请日： 1994-01-21
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公开(公告)号： US5426301A公开(公告)日： 1995-06-20
- 发明人: Patrick Turner
- 申请人： Patrick Turner
- 专利权人： Turner; Patrick
- 当前专利权人： Turner; Patrick
- 优先权： GBX9110960 19910521
- 主分类号： H01J49/04
- IPC分类号： H01J49/04 ; H01J49/06 ; H01J49/26
摘要：
A mass spectometer for analyzing a beam of ions generated from a sample of analyze comprises an analyzer (3) and an interface between the analyze sample (1) and the analyzer. The inlet aperture to the analyzer (13) is positioned off the axis of the ion beam (2) exiting the interface system, and a deflector is (14) provided to generate an electric field between the interface system and the analyzer to deflect the ion beam into the inlet aperture of the analyzer.