发明授权
- 专利标题: Method and an apparatus for detecting concentration of a chemical treating solution and an automatic control apparatus thereof
- 专利标题(中): 用于检测化学处理溶液浓度的方法和装置及其自动控制装置
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申请号: US162187申请日: 1993-12-16
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公开(公告)号: US5450870A公开(公告)日: 1995-09-19
- 发明人: Makoto Suga , Masashi Niwa , Fumio Kojima , Nobumasa Ishida , Koji Kondo
- 申请人: Makoto Suga , Masashi Niwa , Fumio Kojima , Nobumasa Ishida , Koji Kondo
- 申请人地址: JPX Kariya
- 专利权人: Nippondenso Co., Ltd.
- 当前专利权人: Nippondenso Co., Ltd.
- 当前专利权人地址: JPX Kariya
- 优先权: JPX4-98154 19920417; JPX4-138950 19920529
- 主分类号: C23C18/16
- IPC分类号: C23C18/16 ; G05D21/02 ; G05D11/08
摘要:
According to the present invention, the changing rate of the predetermined component concentration is determined, based on the difference between the predetermined component concentration in a chemical treating solution (a plating solution) which is analyzed this time and the predetermined component concentration analyzed last time, both measured by an analytical means, and the difference of each sampling time for analysis of each component concentration by the analytical means (140). Subsequently, the correction amount for the analyzed result of this time based on the changing rate obtained above and the elapsed time from the sampling point of time of the plating solution of this time for analysis of the plating solution by the analytical means to the current point of time (150), and then the analyzed result is corrected based on the resulting correction amount to compute or calculate the current concentration (160). As the result, the current concentration can be detected accurately regardless of the analyzing time of the plating solution by the analytical means.
公开/授权文献
- US6018734A Multi-dimensional pattern analysis 公开/授权日:2000-01-25
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