A scanning circuit apparatus for test includes a first selecting circuit for selecting one of a normal data signal and a scanning data signal by a first control signal and for transmitting the selected data signal, a second selecting circuit for selecting one of a normal clock signal and a scanning clock signal by a second control signal and for transmitting a first clock signal based on the selected clock signal, a data transferring clock signal generating circuit for generating a second clock signal based on a clock signal for transferring data, a latch section connected to the first selecting circuit, the second selecting circuit and the clock signal generating device for receiving the selected data signal, the first clock signal and the second clock signal and for outputting a signal corresponding to the selected data signal and defined by a logical product of the first clock signal and the second clock signal.