发明授权
- 专利标题: Method for manufacturing exposure mask and the exposure mask
- 专利标题(中): 曝光掩模和曝光掩模的制造方法
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申请号: US228504申请日: 1994-04-15
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公开(公告)号: US5543252A公开(公告)日: 1996-08-06
- 发明人: Tsuyoshi Shibata , Koji Hashimoto , Katsuhiko Heida , Kenji Kawano , Shinichi Ito , Keiji Horioka
- 申请人: Tsuyoshi Shibata , Koji Hashimoto , Katsuhiko Heida , Kenji Kawano , Shinichi Ito , Keiji Horioka
- 申请人地址: JPX Kawasaki
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX3-067268 19910329
- 主分类号: G03F1/29
- IPC分类号: G03F1/29 ; G03F1/30 ; G03F1/34 ; G03F9/00
摘要:
A method for manufacturing an exposure mask provided with a substrate for transmitting an exposure light and with phase shifters arranged at prescribed intervals on the substrate for shifting the phase of the exposure light transmitted through the substrate by a half wavelength as compared with the phase of the exposure light transmitted through both the substrate and an opening between the phase shifters consists of the steps of preparing a solution containing a phase shifter material, arranging resist layers at the prescribed intervals on the substrate, immersing the substrate with the resist layers in the solution, forming the phase shifters on the substrate between the resist layers by a prescribed thickness by depositing the material of the phase shifter from the solution, and removing the resist layers from the substrate to form the openings.
公开/授权文献
- US4833781A Adjustable depth gauge for chain saws 公开/授权日:1989-05-30
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