发明授权
US5548404A Multiple wavelength polarization-modulated ellipsometer with phase-generated carrier 失效
具有相位生成载波的多波长偏振调制椭偏仪

Multiple wavelength polarization-modulated ellipsometer with
phase-generated carrier
摘要:
A method and apparatus for analyzing a sample wherein at least two orthogonally polarized, intensity and phase modulated laser beams with different wavelengths and frequencies of intensity and phase modulation are directed onto the sample, and the signals derived from the laser beams which interact with the sample are synchronously demodulated to determine characteristics of the sample such as index of refraction, absorption coefficient and film thickness. A reference beam can be provided to correct for noise and drift.
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