发明授权
US5581463A Pay-per-use access to multiple electronic test capabilities and tester
resources
失效
按用户可以使用多种电子测试功能和测试人员资源
- 专利标题： Pay-per-use access to multiple electronic test capabilities and tester resources
- 专利标题（中）： 按用户可以使用多种电子测试功能和测试人员资源
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申请号： US195435申请日： 1994-02-14
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公开(公告)号： US5581463A公开(公告)日： 1996-12-03
- 发明人: Amanda L. Constant , David W. Webb , Sharon E. LaTourrette , Jeffrey C. Myers , Katherine Z. Withers-Miklos , Kay C. Lannen , Ted T. Turner , Amos H. Leong
- 申请人： Amanda L. Constant , David W. Webb , Sharon E. LaTourrette , Jeffrey C. Myers , Katherine Z. Withers-Miklos , Kay C. Lannen , Ted T. Turner , Amos H. Leong
- 申请人地址： CA Palo Alto
- 专利权人： Hewlett-Packard Co
- 当前专利权人： Hewlett-Packard Co
- 当前专利权人地址： CA Palo Alto
- 主分类号： G01R31/00
- IPC分类号： G01R31/00 ; G01R31/28 ; G06F11/34 ; G06Q30/00 ; G07F7/00 ; G07F7/02 ; G07F17/00 ; G07B15/00
摘要：
A system and method for testing an electronic circuit is disclosed. The system includes a circuit board test platform having multiple electronic test capabilities and multiple hardware resources, and a pay-per-use module that is coupled to the circuit board test platform. The pay-per-use module is adapted for monitoring use of the multiple electronic test capabilities and the hardware resources of the circuit board test platform, and for debiting a number of usage credits from a usage credit pool based on the use of the multiple electronic test capabilities and the tester hardware resources.
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